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Advances in X-Ray Analysis: Volume 26 by Robert L. Snyder (auth.), Camden R. Hubbard, Charles S.

By Robert L. Snyder (auth.), Camden R. Hubbard, Charles S. Barrett, Paul K. Predecki, Donald E. Leyden (eds.)

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443 degrees. Fluorophlogopite, KMg3Si3AI010F2 (abbreviated as FP), was chosen in order to provide a calibrat10n point at lower 29 This material is a synthetic mica with exceptional stability to 47 CAMDEN R. HUBBARD TABLE 1. 533 *Corrected for thermal expansion. 2 °c. t-~9 . 40345 x 10 Table 2. Observed and Calculated 29 (Si sample 11115, a. 004 48 I. ACCURACY IN X-RAY POWDER DIFFRACTION x-ray exposure, humidity and heat. The powder is purposely of large crystallite size «200 mesh) to enhance preferrential orientation in packed mounts.

Although these discrepancies tend to occur in the low and middle 26 range, this is by no means the rule. 02°. Similarly, there is no clearly defined pattern of discrepancies as between specimens of strongly absorbing'Th0 2 and a-Fe203 and those of silicon, quartz and a-AI 20 3 . The overall corrections, on the other hand, display clear family similarities according to how strongly absorbing the sample is. This is seen in the curves for ~d/d versus 26 shown in Fig. 1. 3 are active in the parameter calculations.

M. H. Mueller and 1. Heaton, "Determination of Lattice Parameters with the Aid of a Computer", AEC Research and Development Report, ANL 6176 (1961). K. E. Beu and D. R. Whitney, "Further Developments in the Likelihood Ratio Method for the Precise and Accurate Determination of Lattice Parameters", AEC Research and Development Report, GAT-T-1289/Rev 1 (1965). G. S. Smith and R. L. ,Appl. Cryst. 12 60 (1979). R. Jenkins and F. R. Paolini, "An Automatic Divergence Slit for the Powder Diffractometer", Norelco Reporter 21 9 (1974) .

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